SCEJ 84th Annual Meeting (Tokyo, 2019)
Last modified: 2019-03-12 11:30:00
Program search result : 松坂 修二 : 3 programs
The preprints(abstracts) can be viewed by clicking the Paper IDs.
The ID/PW printed on the PROGRAM book are required.
(The ID/PW have also been sent to the Earlybird registers and invited persons by e-mail.)
The programs of HC-13, HC-17, K-1 were updated.
The ID/PW printed on the PROGRAM book are required.
(The ID/PW have also been sent to the Earlybird registers and invited persons by e-mail.)
The programs of HC-13, HC-17, K-1 were updated.
Authors and Chairs (J) field exact matches “松坂 修二”; 3 programs are found.
The search results are sorted by the start time.
| Time | Paper ID | Title / Authors | Keywords | Topic code | Ack. number |
|---|---|---|---|---|---|
| Day 3 | PE316 | Erectric field dependence of adhesive force of charged particles in external electric field | Adhesive force Airflow method External electric field | 2-f | 119 |
| Day 3 | PE325 | Photoelectric charging of dielectric particle layers and particle levitation | Photoelectric charging Dielectric particle layers Levitation | 2-f | 120 |
| Day 3 | PE327 | Analysis of stress in powder bed by constant-volume shear test and constant-load shear test | Shear test Critical state line Void fraction | 2-f | 212 |
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SCEJ 84th Annual Meeting (Tokyo, 2019)
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