Hall S, Day 2 - Hall and day program - SCEJ 57th Autumn Meeting (Higashihiroshima, 2026)

`SCEJ 57th Autumn Meeting (Higashihiroshima, 2026)`

Last modified: 2026-07-16 06:38:20

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Hall and day program : Hall S, Day 2

The chairs are under negotiation.
Yellow-backs on Technical sessions denote the Hybrid sessions.
(All other sessions are on-site only sessions).

Hall S(103), Day 2(Sep. 15)

SY-75 | SY-76

Time	Paper ID	Title / Authors	Keywords	Topic code	Ack. number
SY-75 [Symposium of Division of Safety] Advanced Process Safety
(9:00–10:00)
9:00– 9:20	S201	Analysis of the Industrial Accidents Caused by Explosions and Fires Using a Fatal Accident Database (JNIOSH) (Reg)Nishiwaki Yosuke	Chemical Safety Industrial accidents analysis	SY-75	90
9:20– 9:40	S202	Age-Related Characteristics of Chemical Substance-Related Explosion and Fire Accidents in the Manufacturing Industry (JNIOSH) *(Reg)Kan Chiemi, (Reg)Nishiwaki Yosuke	Chemical substances Manufacturing industry Age groups	SY-75	267
9:40– 10:00	S203	Preparation of Application Examples of the Reference Materials for Implementing Risk Assessment Based on JNIOSH method (JNIOSH) *(Reg)Sato Yoshihiko, (Reg)Shimada Yukiyasu, (Reg)Nishiwaki Yosuke	Risk assessment Fire and explosion accidents Reactive chemical hazards	SY-75	303
(10:00–10:40)
10:00– 10:40	S204	[Review lecture] Smart Industrial Safety: Evolving with AI (TUAT) (Reg)Yamashita Yoshiyuki	AI DX Smart Industrial Safety	SY-75	259
(10:40–12:00)
10:40– 11:00	S206	[Requested talk] Advancing Smart Industrial Safety with Digital Technologies and AI (Mitsui Chemicals) (Cor)Yasaka Naoto	Smart Industrial Safety Human-AI Collaboration Industrial Data Analytics	SY-75	959
11:00– 11:20	S207	An LLM-Based Scenario Generation Method for Enhancing Incident Response Capabilities Against Cyberattacks (NITech) *(Stu)Konishi Yuta, Koike Hiroto, (Reg)Hamaguchi Takashi, (Reg)Hashimoto Yoshihiro	Incident Response Cyberattack LLM	SY-75	308
11:20– 11:40	S208	Validation of a Value Chain Architecture with CPS Resilience (Fukuoka U.) *(Reg·PCE)Xia J., (JNIOSH) (Reg)Shimada Y., (TUAT) (Reg)Kitajima T.	Value Chain Independent Protection Layer Incident Investigation	SY-75	26
11:40– 12:00	S209	Business Process Model Framework for AI-Enhanced Decision-Making of Safety Management in Chemical Plants (Shizuoka U.) (Reg)Takeda Kazuhiro	Safety Management Decision Making Business Process Model	SY-75	737
SY-76 [Symposium of Division of Electronics] Electronics Materials and Processes
(13:00–14:20)
13:00– 13:40	S213	[Review lecture] The Current Status and Future Prospects of EUVL (U. Hyogo) Watanabe Takeo	EUV Lithography Element technologies of EUVL Next Generation EUVL	SY-76	698
13:40– 14:00	S215	[Invited lecture] Challenges in Wafer Drying Processes and Trends in Pattern Collapse Reduction (Screen Holdings) Nakano Yuui	Pattern collapse Wafer drying	SY-76	637
14:00– 14:20	S216	Cu reduction and OH incorporation to Si insulator by VUV irradiation (Osaka Metro. U.) *(Reg)Saito Takeyasu, Katayama Kaito, Akamatsu Hosei, Endo Shinichi, (Reg)Okamoto Naoki	VUV surface treatment hybrid bonding	SY-76	926
(14:20–15:40)
14:20– 15:00	S217	[Review lecture] Research and development of SiC CMOS integrated circuits and image sensors for extreme environments (Hiroshima U.) Kuroki Shin-Ichiro	SiC CMOS Integrated circuits	SY-76	80
15:00– 15:20	S219	[Invited lecture] Challenges and Recent Advances for the Practical Application of Sulfide All-Solid-State Batteries (AIST) Otoyama Misae	Sulfide All-Solid-State Batteries Solid Electrolytes	SY-76	46
15:20– 15:40	S220	Gas process monitor utilizing quartz crystal microbalance (Yokohama Nat. U.) (Reg)Habuka Hitoshi	quartz crystal microbalance gas process	SY-76	906

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SCEJ 57th Autumn Meeting (Higashihiroshima, 2026)

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