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SCEJ 57th Autumn Meeting
Sep. 14 (Mon) - 16 (Wed), 2026
Higashi-hiroshima Campus, Hiroshima University
Japanese page
This symposium widely accepts papers of the electronic materials and process technologies, containing electroplating, batteries, semiconductor crystals, polymers and any relating issues.
Most recent update: 2026-06-27 21:03:02
 The keywords that frequently used in this topics code. | Keywords | Number | |
|---|---|---|---|
| CMOS | 1 |  | |
| Next Generation EUVL | 1 | | |
| SiC | 1 | | |
| Sulfide All-Solid-State Batteries | 1 | | |
| quartz crystal microbalance | 1 | | |
| surface treatment | 1 | | |
| Solid Electrolytes | 1 | | |
| EUV Lithography | 1 | | |
| gas process | 1 | | |
| VUV | 1 | | |
| Wafer drying | 1 | | |
| hybrid bonding | 1 | | |
| Element technologies of EUVL | 1 | | |
| Pattern collapse | 1 | | |
| Integrated circuits | 1 | | |
| ACKN No. | Title/Author(s) | Keywords | Style |
|---|---|---|---|
| 46 | [Invited lecture] Challenges and Recent Advances for the Practical Application of Sulfide All-Solid-State Batteries | Sulfide All-Solid-State Batteries Solid Electrolytes | O |
| 80 | [Review lecture] Research and development of SiC CMOS integrated circuits and image sensors for extreme environments | SiC CMOS Integrated circuits | O |
| 637 | [Invited lecture] Challenges in Wafer Drying Processes and Trends in Pattern Collapse Reduction | Pattern collapse Wafer drying | O |
| 698 | [Review lecture] The Current Status and Future Prospects of EUVL | EUV Lithography Element technologies of EUVL Next Generation EUVL | O |
| 906 | Gas process monitor utilizing quartz crystal microbalance | quartz crystal microbalance gas process | O |
| 926 | Cu reduction and OH incorporation to Si insulator by VUV irradiation | VUV surface treatment hybrid bonding | O |
Organizing Committee of SCEJ 57th Annual Meeting (2026)
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