製品断面 - Program search result - SCEJ 56th Autumn Meeting (Tokyo, 2025)

`SCEJ 56th Autumn Meeting (Tokyo, 2025)`

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Program search result : 製品断面 : 1 program

The preprints(abstracts) are now open. These can be viewed by clicking the Paper IDs. The ID/PW sent to the Registered participants (excludes free registration) and invited persons are required.

Title (J) field includes “製品断面”; 1 program is found.
The search results are sorted by the start time.

Time	Paper ID	Title / Authors	Keywords	Topic code	Ack. number
Day 1 15:00– 16:30	R110	[Requested talk] Development of an AI-Powered Quality Inspection App for Product Cross-Sections Using a Foundation Model for Image Segmentation (Kaneka) (Cor)Kamo Fumitaka	Image analysis Segment anything	HQ-14	823

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SCEJ 56th Autumn Meeting (Tokyo, 2025)

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