
Last modified: 2025-09-29 10:33:36
| Time | Paper ID | Title / Authors | Keywords | Topic code | Ack. number |
|---|---|---|---|---|---|
| ST-26 [Trans-Division Symposium] CVD/ALD & Dry Process, Control of Structure and Function of Material by Reaction Engineering | |||||
| (9:00–11:00) (Chair: | |||||
| EE201 | Evaluation of the Effects of Wall Adsorption and Transport Phenomena on QCM-Based Adsorption Kinetics Analysis in ALD | ALD Atomic Layer Deposition QCM | ST-26 | 806 | |
| EE202 | Temperature Dependence of TMA Adsorption Kinetics in Al2O3 Atomic Layer Deposition | Atomic Layer Depositon Quartz Crystal Microbalance Surface Adsorption | ST-26 | 336 | |
| EE203 | Computation of Al2O3 ALD by trimethylaluminum with Kinetic Monte Carlo and neural network potential | ALD KMC NNP | ST-26 | 726 | |
| EE204 | Reaction Mechanism Analysis of Mo-CVD/ALD using Mo(CO)6 | Mo(CO)6 step coverage interconnect | ST-26 | 405 | |
| EE205 | [Invited lecture] Development of precursors and deposition processes for atomic layer deposition | Atomic Layer Deposition Precursor ABC-type ALD | ST-26 | 606 | |
| (13:00–15:20) (Chair: | |||||
| EE213 | [Review lecture] The Potential of Quantum Computing in Chemical Reaction Analysis | chemical reaction quantum computer quantum computing | ST-26 | 743 | |
| EE215 | Steric Hindrance Effects and Reaction Kinetics in Co-ALD Using CCTBA Precursor | ALD Atomic Layer Deposition | ST-26 | 801 | |
| EE216 | Molecular dynamics simulations of precursor adsorption in the Co-ALD process using neural network potentials | Atomic layer deposition Neural network potential Growth per cycle | ST-26 | 347 | |
| EE217 | Accurate Estimation of Surface Reaction Rate Constants in SiC-CVD via Neural Network Potentials | SiC CVD Neural network potential | ST-26 | 537 | |
| EE218 | Development of a method for simultaneous measurement of saturated solubility and diffusion coefficient of organometallic compounds in high-temperature supercritical CO2/H2 | Supercritical Fluid Deposition saturation solubility diffusion coefficient | ST-26 | 270 | |
| EE219 | Rate process of SiCxNyOz deposition by room temperature PECVD | PECVD rate process | ST-26 | 6 | |
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SCEJ 56th Autumn Meeting (Tokyo, 2025)
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